YOUR ADVANCED TESTING SOLUTION
patented: US 11,320,477; DE 10 2018 217 406 B4
High speed EFx patented parallel test
Extrem test time reduction by parallel stimulation on all circuit nodes with different multifrequential signal.
Your unique testing solution for all applications
One hybrid tester per channel, full set of instruments per test channel, 16 Bit VISM, 16 Bit AWG, 16 Bit Digitizer, Dig. I/O channel, Low voltage, low current & low power.
The next step in Boardtest, the future
Electronic cluster test to characterize circuit nodes and single components. Universal integration solultions, Iland up to inline Setup.
Flexible Software concept
Easy to integrate in production lines, very small overhead, no frame works required,
Multi software release installation (no application update required, keep the audits).
EFx Technology
We revolutionize the Tester industry.
We have the brightest development and application team to install your EFx Solution for your incredible advantage.
See who we are
Company
The idea for our new tester technology was born decades ago.
The overall advances in the performance and size of electronic components provided the opportunity to ignite this idea and, in 2018, build a company to lead this revolution.
Our motivation
After years of Test Technology stagnation, we are going to revolutionize the market
and offer a multifunction electrical Test at speed of an optical Test.
The Electrical Fotography EFx.
Our project
Our new EFx technology is proven and we are serving our first customers with a breakthrough technology that enables them to combine all the necessary test steps into one, at light speed and ultra-high data volumes, ready for AI production.
Automatic Test Equipment
based on One Tester per Channel (OTpC) Architecture