Base EFx Features

Parallel Parametric AC Test

• stimulate and measure on all contacted circuit    

       nodes synchronous at one time

       Patents: US 11,320,477;  DE 10 2018 217 406 B4

• EFx Cluster Test (2 to  all configured tester channels full parallel multifrequential test)
• EFxICT (2 channel AC test)
• Functional test using resoures independent

Measurement ranges for components measurement

       → Resistance: 1 Ω … 10 MΩ

       → Capacitance: > 1 pF (Z = 1.6 MΩ @ 100 kHz)

       → Inductance: > 1 µH (Z = 0.6 Ω @ 100 kHz)

• Accuracy: 3 digits (12 Bit)

Measure time 4 ms … 128 ms

• Data transfer to PC typical < 1 s (ca. 100 kB je Kanal)
• Data analysis typical < 1 s

Base Specification

 Tester per channel architecture

• VISM 16 Bit (Voltage Current Source and Measurement)

       - Voltage: -12.5 V … +12.5 V AC
       - Current: ±1µA … ±100 mA AC

• AWG Arbitrary Waveform Generator 16 Bit
• Digitizer 16 Bit,
• Scope 16 Bit,

       - 2 Msteps, Bandwidth: 200 kHz

    Resolution instruments: 16 Bits static, 20 Bits dynamic

• Digital: 1.8 V, 2.5V, 3.3, 5 V -- 30 Mbps
• Floating / Galvanic de coupled:

        -   1 kV modul -to- modul, 
        -   100 V between tester channels on one modul